XRF Management Tool Measures PV Thickness
Solar Metrology expanded its SMX XRF tool portfolio for film composition and thickness measurement of CIGS photovoltaic depositions with the addition of the System SMX-Remote static head ILH. Solar Metrology’s System SMX-ILH is atmospheric in-line x-ray fluorescence (XRF) metrology tool platform that provides composition and thickness measurements for thin film solar PV metal film stacks on flexible roll to roll substrates such as stainless steel, aluminum and polyimide... Read More
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