A manufacturer of sensors for automation has developed cameras that enable better inline process and quality control, therefore improving solar cell wafer fabrication. Baumer’s TXG14NIR camera is one of a selection of TX industrial cameras that solve several critical measurement tasks in the production of solar cells.
The TXG14NIR near-infrared camera measures electroluminescence to help detect fractures and failures in the crystal structure.
With enhanced sensitivity in the near infrared, the camera is well-suited for automatic inspection of wafers. Measuring electroluminescence using near infrared imaging cameras helps detect fractures and failures in the crystal structure. These images give information on the quality and effectiveness of each wafer prior to the next processing step.
The camera offers a high sensitivity at the required wavelengths, as well as high resolution images with 1392 x 1040 pixels. Structural defects within the wafer can be easily detected, allowing better quality control in any wafer handling process.
Baumer Group www.baumer.com
